NE6000 LTE-A Network Emulator
Advanced LTE-A Signaling Test Solution
The LTE-A Network Emulator NE6000 is designed for rich system testing of LTE-A mobile device, such as smartphone, tablets, router, MiFi, and M2M products. NE6000 emulates a complete LTE-A network system with eNB and true EPC. NE6000 not only offers unprecedented diagnosis & troubleshooting capabilities for LTE-A system development and debug, but also tailors for production line and QA/QC.

More Efficient System Testing Supporting LTE-A Mobile Device Development
Integrating eNB (including PCC and SCC), MME, S-GW, and P-GW all in one box to support Carrier Aggregation (CA) technology, NE6000 behaves closer to a commercially operated LTE-A network in real world. All complex functional and application test scenarios (such as multiple PDN, IPv4/IPv6, QoS, VoLTE, OMA-DM/TR-069) can be set up and configured easily in NE6000.

NE6000 delivers various features for UE development

NE6000 LTE-A Network Emulator consists of an eNB emulator and an EPC emulator. NE6000 Network Emulator is available in a 2U rack mountable form factor and used to communicate with DUT(s) from LTE-Uu interface.
Key Features
- LTE-A FDD/TDD Dual Mode
- Dual 2x2 MIMO
- 2CC Carrier Aggregation (CA)
- LTE-A Cat.1 ~ Cat.6
- Frequency Range 400MHz ~ 3.8GHz
- 1.4/3/5/10/15/20MHz Frequency BW
- Network Attach Test
- IP Throughput Performance Test (e.g. FTP/Iperf)
- MAC Throughput Performance Test
- IPv4/IPv6 Functional Test
- Multiple PDN (max. 8 PDN) Functional Test
- QoS GBR/non-GBR and Traffic Priority Functional Test
- Integrated Protocol Analyzer
- UL UE Target Power Setting (UE Max. TX Power)
- DL Reference Output Power Level Setting (Reference Sensitivity)
- DL RSSI Reporting
Applications
- R&D Test
- PA/QA/QC Test
- End-of-Line Test
- Stability & Reliability Test
- Application Test
- Interference Test
- End-to-End System Test
- Functional Test
- System Integration Test
- EMI/EMC Test
- Elevated Temperature/Voltage Test
- Power Consumption Test
- Burn-in Test
- Product Mechanical Verification
- Thermal Design Verification
- Test Center
- Repair Center
- Pre-IOT Test
Friendly GUI and Useful Test Tool
NE6000 implements 3 kinds of testing suite (CTS,ATS,MTS) to cover various testing scenarios and testing segments to help users efficiently diagnostic and analyze LTE-A device development and integration issues. NE6000 also supports all test functions and features of NE2000 and NE3000.
R&D Verification – CTS
NE6000 comes with a feature-rich control and measurement software GUI, allowing users to obtain key performance insight of the DUT with easy configuration. A powerful built-in protocol analyzer can capture and examine protocol messages between DUT and eNB/EPC to help identify and resolve system design issues. CTS tool provides the feature-rich control and measurement GUI to allow users to obtain key performance insight of the DUT with easy configuration.

QA/QC Verification - MTS
MTS tool provides the most cost-effective LTE-A network
environment for testing long term stability and reliability
performance of DUT under various scenarios such as
◇ EMI/EMC
◇ Power consumption
◇ Battery life analysis
◇ Burn-in
◇ Elevated temperature/voltage
MTS tool can replace or offload pricy full-feature LTE
tester to achieve optimal test resource allocation and
best ROI.


Production Test Solution – ATS

Network Attach Test
Network Attach Testing is the most important testing item for signaling test. This testing item is to verify the whole LTE-A system behavior of DUT to make sure that the DUT could successfully communicate with LTE-A network. All message handshaking which is shown in the below figure could be verified in this testing item.

Power Measurement and Modulation Analysis
NE6000 Solution provides real-time power measurement and modulation analysis including DLRSRP/DL RSRQ/DL RSSI, and UL Tx Power in the connecting status of DUT(s). The testing item allows user to get the RF performance in the environment that is close to real network. The results could help figure out the issue of DUT(s) system integration.

IP Throughput Test and MAC Level Throughput Test
NE6000 Solution provides IP Throughput Test and MAC Level Throughput Test when DUT is con-necting with NE6000 to get the real data rate throughput the whole system of DUT(s). For IP Throughput Test, NE6000 supports iperf freeware with simple and convenient testing procedure. For MAC Level Throughput Test, users just need to configure the test duration and test criterion in GUI, then this test could run automatically without controlling the DUT(s).

Application Test (FTP, IPv6)
NE6000 provides FTP and IPv6 application test software option to customers. We integrate the FTP server and IPv6 domain router to allow that the customers just need to configure the DUT setting to rapidly execute these testing items.

Multiple PDN (max. 8 PDN) Functional Test:
NE6000 provides up to 8 PDN to support installation in test network with multiple services by friendly UI, it’s easy to set up the parameters of PDN including Access Point Name, PDN Type, O-Flag, IPv4 Prefix, IPv6 prefix.

