NE6000 LTE-A Network Emulator

Advanced LTE-A Signaling Test Solution

The LTE-A Network Emulator NE6000 is designed for rich system testing of LTE-A mobile device, such as smartphone, tablets, router, MiFi, and M2M products. NE6000 emulates a complete LTE-A network system with eNB and true EPC. NE6000 not only offers unprecedented diagnosis & troubleshooting capabilities for LTE-A system development and debug, but also tailors for production line and QA/QC.



More Efficient System Testing Supporting LTE-A Mobile Device Development

Integrating eNB (including PCC and SCC), MME, S-GW, and P-GW all in one box to support Carrier Aggregation (CA) technology, NE6000 behaves closer to a commercially operated LTE-A network in real world. All complex functional and application test scenarios (such as multiple PDN, IPv4/IPv6, QoS, VoLTE, OMA-DM/TR-069) can be set up and configured easily in NE6000.

NE6000 delivers various features for UE development

NE6000 LTE-A Network Emulator consists of an eNB emulator and an EPC emulator. NE6000 Network Emulator is available in a 2U rack mountable form factor and used to communicate with DUT(s) from LTE-Uu interface.

Key Features

  • LTE-A FDD/TDD Dual Mode
  • Dual 2x2 MIMO
  • 2CC Carrier Aggregation (CA)
  • LTE-A Cat.1 ~ Cat.6
  • Frequency Range 400MHz ~ 3.8GHz
  • 1.4/3/5/10/15/20MHz Frequency BW
  • Network Attach Test
  • IP Throughput Performance Test (e.g. FTP/Iperf)
  • MAC Throughput Performance Test
  • IPv4/IPv6 Functional Test
  • Multiple PDN (max. 8 PDN) Functional Test
  • QoS GBR/non-GBR and Traffic Priority Functional Test
  • Integrated Protocol Analyzer
  • UL UE Target Power Setting (UE Max. TX Power)
  • DL Reference Output Power Level Setting (Reference Sensitivity)
  • DL RSSI Reporting

Applications

  • R&D Test
  • PA/QA/QC Test
  • End-of-Line Test
  • Stability & Reliability Test
  • Application Test
  • Interference Test
  • End-to-End System Test
  • Functional Test
  • System Integration Test
  • EMI/EMC Test
  • Elevated Temperature/Voltage Test
  • Power Consumption Test
  • Burn-in Test
  • Product Mechanical Verification
  • Thermal Design Verification
  • Test Center
  • Repair Center
  • Pre-IOT Test

Friendly GUI and Useful Test Tool

NE6000 implements 3 kinds of testing suite (CTS,ATS,MTS) to cover various testing scenarios and testing segments to help users efficiently diagnostic and analyze LTE-A device development and integration issues. NE6000 also supports all test functions and features of NE2000 and NE3000.

R&D Verification – CTS

NE6000 comes with a feature-rich control and measurement software GUI, allowing users to obtain key performance insight of the DUT with easy configuration. A powerful built-in protocol analyzer can capture and examine protocol messages between DUT and eNB/EPC to help identify and resolve system design issues. CTS tool provides the feature-rich control and measurement GUI to allow users to obtain key performance insight of the DUT with easy configuration.

Production Test Solution – ATS

ATS tool implements signaling testing methodology that enables final DUT verification at the end of pro-duction line. ATS tool measures key DUT performance items such as network attach, MAC/IP throughput, DL/UL power and so on in a fast and efficient way to save significant costs. Built-in configuration editor and test plan editor allow users to flexibly program test items and pass/fail criterion. Test results are dis-played real time and also logged into report files for test record and offline analysis.

Network Attach Test

Network Attach Testing is the most important testing item for signaling test. This testing item is to verify the whole LTE-A system behavior of DUT to make sure that the DUT could successfully communicate with LTE-A network. All message handshaking which is shown in the below figure could be verified in this testing item.

Power Measurement and Modulation Analysis

NE6000 Solution provides real-time power measurement and modulation analysis including DLRSRP/DL RSRQ/DL RSSI, and UL Tx Power in the connecting status of DUT(s). The testing item allows user to get the RF performance in the environment that is close to real network. The results could help figure out the issue of DUT(s) system integration.

IP Throughput Test and MAC Level Throughput Test

NE6000 Solution provides IP Throughput Test and MAC Level Throughput Test when DUT is con-necting with NE6000 to get the real data rate throughput the whole system of DUT(s). For IP Throughput Test, NE6000 supports iperf freeware with simple and convenient testing procedure. For MAC Level Throughput Test, users just need to configure the test duration and test criterion in GUI, then this test could run automatically without controlling the DUT(s).

Application Test (FTP, IPv6)

NE6000 provides FTP and IPv6 application test software option to customers. We integrate the FTP server and IPv6 domain router to allow that the customers just need to configure the DUT setting to rapidly execute these testing items.

Multiple PDN (max. 8 PDN) Functional Test:

NE6000 provides up to 8 PDN to support installation in test network with multiple services by friendly UI, it’s easy to set up the parameters of PDN including Access Point Name, PDN Type, O-Flag, IPv4 Prefix, IPv6 prefix.

Integrated Protocol Analyzer:

NE6000 provides a powerful built-in protocol analyzer which can capture and examine protocol messages (RRC/NAS/IP Layer) between DUT and eNB/EPC to help identify and resolve system design issue.

Quality of Service

In order to provide more efficient and better quality of services in LTE-A system, LTE-A network architec-ture defines the end-to-end bearer service architecture to fulfill the request of QoS. The QoS test consists of GBR Bearers (Dedicated Bearers) and non-GBR Bearers (Default/Dedicated Bearers) is guaranteed for LTE products to meet LTE QoS requirements. NE6000 provides friendly configuration of the key parame-ters of GBR Bearers and non-GBR Bearers to support QoS test.

NE6000 More Features